Semiconductor Device with Drain Structure and Metal Drain Electrode

ABSTRACT

A semiconductor device includes transistor cells formed along a first surface at a front side of a semiconductor body and having body regions of a first conductivity type, a drift region of a second conductivity type that is opposite from the first conductivity type and is disposed between the body regions and a second surface of the semiconductor body that is opposite from the first surface, and an emitter layer of the second conductivity type that is disposed between the drift region and a second surface of the semiconductor body, the emitter layer having a higher dopant concentration than the drift region, a metal drain electrode directly adjoining the emitter layer. The metal drain electrode comprises spikes extending into the emitter layer.

RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.16/134,473 filed on 18 Sep. 2018, which in turn is a divisional of U.S.application Ser. No. 15/664,094 filed on 31 Jul. 2017, which in turnclaims priority to German patent application 102016114389.8 filed on 3Aug. 2016, the content of each document being incorporated by referenceherein in its entirety.

BACKGROUND

Power semiconductor devices conduct a high load current and withstand ahigh blocking voltage. Superjunction devices include a superjunctionstructure with oppositely doped first and second regions formed in adrift zone which is electrically arranged in series to controllableMOSFET channels. When a blocking voltage is applied to the superjunctiondevice, a lateral electric field rises and clears out the mobile chargecarriers along the vertical pn junctions between the first and secondregions. A space charge zones begins to expand perpendicularly to thedirection of a load current flow in the on-state. The mobile chargecarriers are completely forced out of the superjunction structure at acomparatively low blocking voltage. When the blocking voltage is furtherincreased, the depleted superjunction structure acts as aquasi-intrinsic layer and the vertical electric field rises.

The breakdown voltage is decoupled from the dopant concentrations in thesuperjunction structure such that the dopant concentration in thesuperjunction structure can be comparatively high. Thereforesuperjunction devices typically combine very low on-state resistancewith high blocking capability. The efficiency of the superjunctionstructure in terms of blocking capability and semiconductor volume isthe better the better the dopant atoms in the oppositely doped regionsof the superjunction structure are balanced and compensate each other.

It is desirable to improve superjunction semiconductor devices.

SUMMARY

According to an embodiment, a method of manufacturing semiconductordevices includes forming, by epitaxy, an epitaxial layer on a basesubstrate at a front side. From opposite to the front side, at least aportion of the base substrate is removed, wherein the base substrate iscompletely removed or a remnant base section has a thickness of at most20 μm. Dopants of a first charge type are implanted from opposite of thefront side into an implant layer of the epitaxial layer. A metal drainelectrode is formed opposite to the front side and heats at least theimplant layer to a temperature not higher than 500° C., wherein theheating activates only a portion of the implanted dopants in the implantlayer and after heating an integrated concentration of activated dopantsalong a shortest line between the metal drain electrode and a closestdoped region of a second, complementary charge type is at most 1.5E13cm⁻².

According to another embodiment a semiconductor device includestransistor cells formed along a first surface at a front side of asemiconductor portion and further includes a drain structure between thetransistor cells and a second surface of the semiconductor portionopposite to the first surface. The drain structure forms first pnjunctions with body regions of the transistor cells and includes anemitter layer directly adjoining the second surface. A metal drainelectrode directly adjoins the emitter layer. An integratedconcentration of activated dopants along a shortest line between themetal drain electrode and a closest doped region of a charge type of thebody regions is at most 1.5E13 cm⁻².

According to a further embodiment a semiconductor device includestransistor cells formed along a first surface at a front side of asemiconductor portion and further includes a drain structure between thetransistor cells and a second surface of the semiconductor portionopposite to the first surface. The drain structure forms first pnjunctions with body regions of the transistor cells and includes auniformly doped remnant base section directly adjoining the secondsurface, wherein a vertical extension of the remnant base section is atmost 20 μm. A metal drain electrode directly adjoins the remnant basesection.

Those skilled in the art will recognize additional features andadvantages upon reading the following detailed description and onviewing the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide a furtherunderstanding of the invention and are incorporated in and constitute apart of this specification. The drawings illustrate embodiments of thepresent invention and together with the description serve to explainprinciples of the invention. Other embodiments of the invention andintended advantages will be readily appreciated as they become betterunderstood by reference to the following detailed description.

FIG. 1A is a schematic vertical cross-sectional view of a portion of abase substrate for illustrating a method of manufacturing asemiconductor device including a super junction structure according toan embodiment with a complete removal of a base substrate.

FIG. 1B is a schematic vertical cross-sectional view of a portion of asemiconductor substrate obtained by forming an epitaxial layer with asuperjunction structure on the base substrate of FIG. 1A.

FIG. 1C is a schematic vertical cross-sectional view of thesemiconductor substrate portion of FIG. 1B, after forming transistorcells at a front side.

FIG. 1D is a schematic vertical cross-sectional view of thesemiconductor substrate portion of FIG. 1C, after removing the basesubstrate.

FIG. 1E is a schematic vertical cross-sectional view of thesemiconductor substrate portion of FIG. 1D, after implanting dopantsinto the epitaxial layer and forming a metal drain electrode.

FIG. 1F is a schematic vertical cross-sectional view of thesemiconductor substrate portion of FIG. 1E, after soldering asemiconductor die obtained from the semiconductor substrate of FIG. 1Eon a die carrier.

FIG. 1G is a schematic diagram showing a vertical dopant distributionalong line I-I of FIG. 1F, after a heating treatment.

FIG. 2A is a schematic vertical cross-sectional view of a semiconductorsubstrate portion for illustrating a further method of manufacturing asemiconductor device including a super junction structure according toan embodiment with a partial removal of a base substrate, after removinga section of the base substrate of the semiconductor substrate portionof FIG. 1C.

FIG. 2B is a schematic vertical cross-sectional view of thesemiconductor substrate portion of FIG. 2A, after forming a metal drainelectrode at the back side.

FIG. 2C is a schematic diagram showing a vertical dopant distributionalong line II-II of FIG. 2B.

FIG. 3A is a schematic vertical cross-sectional view of a portion of asemiconductor device according to an embodiment referring to animplanted emitter layer and a metal drain electrode including spikes.

FIG. 3B is a schematic vertical cross-sectional view of a portion of asemiconductor device according to an embodiment with a remnant sectionof a base substrate and a metal drain electrode without spikes.

FIG. 4A is a schematic vertical cross-sectional view of a portion of asemiconductor device with a thick base substrate according to areference example for discussing effects of the embodiments.

FIG. 4B is a schematic vertical cross-sectional view of a portion of asemiconductor device with an emitter layer and a field stop layeraccording to an embodiment.

FIG. 4C is a schematic diagram for comparing vertical charge carrierdistributions along line III-III of FIG. 4A and along line IV-IV in FIG.4B for discussing effects of the embodiments.

FIG. 5A is a schematic diagram for illustrating effects of theembodiments on the reverse recovery charge.

FIG. 5B is a schematic diagram illustrating the reverse recovery chargeas a function of a thickness of a semiconductor die for discussingeffects of the embodiments.

FIG. 5C is a schematic diagram illustrating the impact of the thicknessof a base substrate on the on-state resistance for discussing effects ofthe embodiments.

FIG. 5D is a schematic diagram illustrating the impact of the thicknessof a base substrate on the reverse recovery charge for discussingeffects of the embodiments.

FIG. 6A is a schematic vertical cross-sectional view of a power fieldeffect transistor with a lightly doped drift zone according to anembodiment concerning a completely removed base substrate.

FIG. 6B is a schematic diagram illustrating a vertical dopantdistribution along line B-B of FIG. 6A.

FIG. 7A is a schematic vertical cross-sectional view of a power fieldeffect transistor with super junction structure according to anembodiment concerning a completely removed base substrate and.

FIG. 7B is a schematic diagram illustrating a vertical dopantdistribution along line B-B of FIG. 7A.

FIG. 8A is a schematic vertical cross-sectional view of a power fieldeffect transistor with a lightly doped drift zone according to anembodiment concerning a remnant base section.

FIG. 8B is a schematic diagram illustrating a vertical dopantdistribution along line B-B of FIG. 8A.

FIG. 9A is a schematic vertical cross-sectional view of a power fieldeffect transistor with super junction structure according to anembodiment concerning a remnant base section.

FIG. 9B is a schematic diagram illustrating a vertical dopantdistribution along line B-B of FIG. 9A.

DETAILED DESCRIPTION

In the following detailed description, reference is made to theaccompanying drawings, which form a part hereof and in which are shownby way of illustrations specific embodiments in which the invention maybe practiced. It is to be understood that other embodiments may beutilized and structural or logical changes may be made without departingfrom the scope of the present invention. For example, featuresillustrated or described for one embodiment can be used on or inconjunction with other embodiments to yield yet a further embodiment. Itis intended that the present invention includes such modifications andvariations. The examples are described using specific language, whichshould not be construed as limiting the scope of the appending claims.The drawings are not scaled and are for illustrative purposes only.Corresponding elements are designated by the same reference signs in thedifferent drawings if not stated otherwise.

The terms “having”, “containing”, “including”, “comprising” and the likeare open, and the terms indicate the presence of stated structures,elements or features but do not preclude the presence of additionalelements or features. The articles “a”, “an” and “the” are intended toinclude the plural as well as the singular, unless the context clearlyindicates otherwise.

The term “electrically connected” describes a permanent low-ohmicconnection between electrically connected elements, for example, adirect contact between the concerned elements or a low-ohmic connectionthrough a metal and/or a heavily doped semiconductor. The term“electrically coupled” includes that one or more intervening element(s)adapted for signal transmission may be provided between the electricallycoupled elements, for example, elements that are controllable totemporarily provide a low-ohmic connection in a first state and ahigh-ohmic electric decoupling in a second state.

The Figures illustrate relative doping concentrations by indicating “−”or “+” next to the doping type “n” or “p”. For example, “n⁻” means adoping concentration which is lower than the doping concentration of an“n”-doping region while an “n⁺”-doping region has a higher dopingconcentration than an “n”-doping region. Doping regions of the samerelative doping concentration do not necessarily have the same absolutedoping concentration. For example, two different “n”-doping regions mayhave the same or different absolute doping concentrations.

FIG. 1A shows a base substrate 105, which may be obtained from asemiconductor crystal, e.g., by sawing. The base substrate 105 may becomparatively heavily doped, wherein the dopant concentration in thebase substrate 105 is approximately uniform.

The semiconductor material of the base substrate 105 may be silicon(Si), germanium (Ge), silicon germanium (Site) or an A_(III)B_(V)semiconductor. For example, the base substrate 105 is a silicon wafer. Athickness of the base substrate 105 between a process surface 107 at afront side and a support surface 108 on the back may be in a range ofseveral hundred μm, for example between 500 μm and 850 μm, e.g., about725 μm for a silicon wafer with a diameter of 200 mm and about 775 μmfor a silicon wafer with a diameter of 300 mm. Directions parallel tothe exposed process surface 107 of the base substrate 105 are horizontaldirections. A normal to the process surface 107 defines a verticaldirection.

An epitaxial layer 106 with a superjunction structure 180 is formed onthe process surface 107 at a front side of the base substrate 105.Formation of the superjunction structure 180 may be interleafed with theformation of the epitaxial layer 106, wherein in amulti-epi/multi-implant process formation of epitaxial sublayers alterswith implants for the formation of oppositely doped superjunctionregions. According to other embodiments, the superjunction structure 180is formed by forming a thick epitaxial sublayer, forming trenches in thethick epitaxial sublayer and, e.g., implanting dopants through sidewallsof the trenches or depositing doped layers in the trenches.

FIG. 1B shows a superjunction structure 180 in an epitaxial layer 106formed at the front side of the base substrate 105. The superjunctionstructure 180 includes first regions 181 of a first charge typecorresponding to a first conductivity type and second regions 182 of acomplementary second charge type corresponding to a second conductivitytype. Planes of equal doping concentration may be approximately planarand vertical or may include several bulges along the vertical direction.

Transistor cells TC are formed at the front side of a semiconductorsubstrate 500 a that includes the base substrate 105 and the epitaxiallayer 106 with the superjunction structure 180. The transistor cells TCmay be IGFET (insulated gate field effect transistor) cells electricallyconnected in parallel to each other. The transistor cells TC may haveplanar gates with gate electrodes formed above the main surface 101 a ofthe semiconductor substrate 500 a or may be trench gates extending fromthe main surface 101 a into the semiconductor substrate 500 a. Formationof the transistor cells TC may include formation of a further epitaxialsublayer above the superjunction structure 180.

FIG. 1C shows the transistor cells TC formed at the front side of thesemiconductor substrate 500 a. The illustrated embodiment refers totransistor cells TC, which are n-IGFETs with p-type body regions 120that directly adjoin the p-type second regions 182 of the superjunctionstructure 180 and that separate n-type source regions 110 from n-typefirst regions 181 of the superjunction structure 180. Other embodimentsrefer to p-IGFET cells with complementary doping.

After formation of the transistor cells TC, for example after formationof a metal source electrode 310 electrically connected with the bodyregions 120 and with the source regions 110 of the transistor cells TCthrough openings in an interlayer dielectric 210 sandwiched between themain surface 101 a and the metal source electrode 310, a substratecarrier 390 may be attached to the semiconductor substrate 500 a at thefront side.

A thinning process removes at least a portion of the base substrate 105.The thinning process may be a wafer splitting process along a porousportion of the base substrate 105 or a grinding process. The thinningprocess may remove the complete base substrate 105 and, if applicable,an exposed portion of the epitaxial layer 106 or may leave a remnantbase section of the base substrate 105, wherein the remnant base sectionhas a thickness of not more than 20 μm. In case the base substrate 105is completely removed, any conductivity type can be chosen for the basesubstrate 105.

FIG. 1D shows the semiconductor substrate 500 a with the base substrate105 of FIG. 1C completely removed and with an implant surface 102 a ofthe epitaxial layer 106 exposed on the back opposite to the substratecarrier 390. A distance a1 between the implant surface 102 a and thesecond region 182 of the superjunction structure 180 is at most 50 μm,e.g., at most 25 μm.

Dopants of the first charge type, e.g., donors in case of n-channeltransistor cells TC, are implanted from the back through the implantsurface 102 a to form an implant layer 138 along the implant surface 102a. A metal or metallization stack is deposited on the implant surface102 a to form a metal drain electrode 320. A metallization stack of themetal drain electrode 320 may include a nickel silver (NiAg) layer forsoft soldering or a gold tin (AuSn) layer for diffusion soldering. Themetal drain electrode 320 may have a flat interface to the epitaxiallayer 106 or may include protrusions extending into the epitaxial layer106.

FIG. 1E shows the implant layer 138 formed along the implant surface 102a. A heating treatment may be applied, wherein a maximum temperature ofthe heating treatment is at most 500° C., e.g., at most 350° C. suchthat only a portion of the implanted dopants in the implant layer 138gets activated. The heating treatment may be a dedicated heat treatment,e.g. in a furnace. According to other embodiments, a process forattaching a semiconductor die 500 b obtained from the semiconductorsubstrate 500 a of FIG. 1E by sawing includes a soldering process, forexample, soft soldering or diffusion soldering, at temperatures of atmost 350° C., wherein the soldering process anneals and activates only aportion of the implanted dopants.

FIG. 1F shows a semiconductor device 500 obtained by soldering asemiconductor die 500 b obtained from the semiconductor substrate 500 aof FIG. 1E by removing the substrate carrier 390 from the front side andsawing the semiconductor substrate 500 a along separation traces.

A solder layer system 365 mechanically and electrically connects themetal drain electrode 320 with a die carrier 360 such as a copper plate.A dedicated heat treatment and/or the soldering process activates aportion of the implanted dopants and transforms the implanted layer 138of FIG. 1E into an emitter layer, wherein an integrated activated donorconcentration along a shortest line connecting the metal drain electrode320 with the closest doped region of a conductivity type opposite to theconductivity type of the emitter layer 139 is not greater than 1.5E13cm⁻², for example, not greater than 8E12 cm⁻².

In the presence of the superjunction structure 180, the closest dopedregions of the conductivity type opposite to the conductivity type ofthe emitter layer 139 are the second regions 182 of the superjunctionstructure 180. In absence of a superjunction structure, the closestdoped regions of the conductivity type opposite to the conductivity typeof the emitter layer 139 may be the body regions 120 of the transistorcells TC.

The activated donors define a backside emitter layer 139 which issufficiently strong to emit electrons in the on-state of the IGFET underforward bias and to allow tunneling of holes into the metal drainelectrode 320 under reverse bias. Holes reaching the metal drainelectrode 320 and recombining therein reduce the emitter efficiency atthe backside such that the mean charge carrier plasm density in case ofa forward conducting body diode is significantly reduced. Recombinationof the holes in the metal drain electrode 320 pins a hole density tozero at the interface between backside emitter layer 139 and metal drainelectrode 320. With the hole density pinned to zero at thesemiconductor/metal interface between the emitter layer 139 and themetal drain electrode 320, a hole distribution steadily declines fromthe superjunction structure 180 towards the semiconductor/metalinterface. As a result, the total reverse recovery charge Qrr isdrastically reduced.

FIG. 1G shows a vertical donor distribution 401 and a vertical acceptordistribution 402 along line I-I of FIG. 1F, wherein the donordistribution 401 falls from a maximum donor density N_(E) close themetal/semiconductor interface to a comparatively low drift zone donordensity N_(drift) within a distance corresponding to a verticalextension a0 of the emitter layer 139.

FIGS. 2A to 2C refer to an alternative embodiment to FIGS. 1C to 1F,wherein only a portion of the base substrate 105 of FIG. 1C is removedand a thin remnant base section 105 a with a recessed surface 102 bforms a section of the semiconductor portion of a semiconductor device.

According to FIG. 2A, a remaining thickness a3 of the thinned remnantbase section 105 a is at most 20 μm, for example, at most 10 μm, or atmost 8 μm.

Dopants may be implanted through the remnant base section 105 a into theepitaxial layer 106, a metal drain electrode 320 is formed on therecessed surface 102 b and individual semiconductor dies 500 b areobtained from the semiconductor substrate 500 a as discussed withreference to FIGS. 1E and 1F.

FIG. 2B shows a semiconductor die 500 b obtained by, e.g., sawing fromthe semiconductor substrate 500 a of FIG. 2A. A semiconductor portion100 includes a drain contact structure 137 obtained from the remnantbase section 105 a of FIG. 2A.

FIG. 2C shows a vertical donor distribution 411 and a vertical acceptordistribution 412 along line II-II of FIG. 2B, wherein the donordistribution 411 is approximately uniform with the drain contactstructure 137. According to an embodiment, a field stop layer may beformed between the superjunction structure 180 and the drain contactstructure 137.

FIGS. 3A and 3B refer to details of the electric contact at asemiconductor/metal interface on the back of semiconductor devices 500.

In FIG. 3A a base substrate is completely removed and a backside emitterlayer 139 is formed in a semiconductor portion 100 obtained from anepitaxial layer. The metal drain electrode 320 directly adjoins thesemiconductor portion 100. The implant of dopants from the back and aheating treatment, e.g., in course of a soldering, generates a backsideemitter layer 139. In the backside emitter layer 139 the dopantconcentration is higher than in a section of a drift zone 131 directlyadjoining the backside emitter layer 139 or, in the presence of a fieldstop layer, in a section of the field stop layer directly adjoining theemitter layer 139. The implant may partially amorphize a section of thesemiconductor portion 100. The metal and the silicon form a eutecticsolution, wherein the solubility of silicon in aluminum is comparativelyhigh. Silicon atoms diffusing into the metal drain electrode 320 leavevoids into which spikes 321 of metal or a metal alloy containing silicongrow.

FIG. 3A shows spikes 321 of different height extending from the secondsurface 102 into the backside emitter layer 139. A maximum verticalextension v1 of the spikes 321 may be greater than 1 μm, for example,about 4 μm.

An integrated activated donor concentration along a shortest line 322connecting the metal drain electrode 320 with any of the second regions182 of a superjunction structure 180 is not greater than 1.5E13 cm⁻²,for example, not greater than 8E12 cm⁻².

Under reverse bias, a body diode formed by the drain structure 130 andthe body regions connected to the second regions 182 of thesuperjunction structure is forward biased and a forward current flowsthrough the semiconductor portion. A hole plasma that forms in thesemiconductor portion 100 when the body diode is forward biased ispinned to zero at the top of the spikes 321. The holes reach the metaldrain electrode 320 and recombine therein, thereby reducing electronemitter efficiency. Due to the reduced emission of electrons, theoverall plasma density in the semiconductor portion 100 drasticallydecreases. On the other hand, the emitter layer 139 can be asufficiently robust electron emitter as long as the integrated dopantconcentration along the shortest line 322, i.e., along the narrowestpath between the metal drain electrode 320 and a pn junction is lessthan 1E13 cm⁻².

FIG. 3B shows a metal drain electrode 320 directly adjoining a draincontact structure 137 formed from a remnant base section 105 a of a basesubstrate as shown in FIG. 2A, wherein the drain contact structure 137has a thickness of at most 20 μm, for example at most 5 μm. Within thedrain contact structure 137 the hole concentration falls to zero. If thedrain contact structure 137 is sufficiently thin, the hole density atthe interface between the drift zone 131 and the drain contact structure137 is lower than in a comparative example with a thick base substratesuch that reverse recovery charge is drastically reduced even if thehole density at the interface between the drift zone 131 and the draincontact structure 137 is not equal 0.

FIGS. 4A to 4C compare the hole distribution in a conventional devicewith the hole distribution in a semiconductor device according to theembodiments.

FIG. 4A shows a portion of a comparative device 509 with a semiconductorportion 100 and a metal drain electrode 320 directly adjoining thesemiconductor portion 100 at a second surface 102 on the back. Thesemiconductor portion 100 includes a heavily n-doped drain contactstructure 137 formed from a substrate section which is thicker than 20μm and an epitaxial section that includes inter alia a drift zone 131and a field stop layer 135 sandwiched between the drift zone 131 and thedrain contact structure 137. A lightly doped drift zone portion 131 amay separate n-doped first regions 181 and p-type second regions 182 ofa superjunction structure 180 from the field stop layer 135.

In FIG. 4C, a first vertical net dopant distribution 421 shows the netdopant concentration N_(nIII)(y) as a function of a vertical distance dto the superjunction structure 180 for the comparative device 509. Thenet dopant distribution 421 includes a section of high doping in thedrain contact structure 137.

In FIG. 4C, the hole distribution 425 shows the hole density N_(hIII)(y)as a function of the vertical distance y to the superjunction structure180. In case the body diode of the comparative device 509 is forwardbiased, the hole distribution 425 significantly drops only within theheavily doped drain contact structure 137 and has a comparatively highlevel in the superjunction structure 180 and between the superjunctionstructure 180 and the drain contact structure 137.

In the semiconductor device 500 of FIG. 4B, the base substrate iscompletely removed and the metal drain electrode 320 directly adjoins anemitter layer 139 formed by implant in a section of an epitaxial layer.The integrated dopant concentration along a shortest line 322 betweenthe outermost spikes and the bottom of the p-type second regions 182 ofthe superjunction structure 180 is at most 1.5E13 cm⁻² as defined inequation (1).

$\begin{matrix}{{\int_{0}^{d_{2}}{{N_{D}(y)}\ {dy}}} \leq {1.5\; E\; 13\mspace{14mu} {cm}^{- 3}}} & (1)\end{matrix}$

In FIG. 4C, a second vertical net dopant distribution 422 shows the netdopant concentration N_(nIV)(y) as a function of a vertical distance yto the superjunction structure 180 for the semiconductor device 500 ofFIG. 4B.

The corresponding hole distribution 426 shows the corresponding holedensity N_(hIV)(y) as a function of the vertical distance y to thesuperjunction structure 180. In case the body diode of the semiconductordevice 500 of FIG. 4B is forward biased, the hole distribution 426 inthe metal drain electrode 320 is equal to 0 and drops to zero within theepitaxial layer to equal 0.

The shaded area indicates the difference between the hole density in theconventional device 509 and the hole density in the semiconductor device500 according to the embodiments and is a measure for the reduction ofthe hole plasma and the reverse recovery charge.

In FIG. 5A, a first distribution 431 shows measured values of thereverse recovery charge Q_(rr) for a device with a thickness of thesemiconductor die of 220 μm at different values for the gate resistanceR_(g). A second distribution 432 shows the equivalent distribution forcomparative semiconductor devices with a total thickness of 90 μm,wherein the base substrate is thinned by 130 μm. The thinning leads to areduction of the reverse recovery charge to about 30%. The reductionpoints to a significantly reduced charge carrier plasma density in aportion of the semiconductor die outside of the base substrate. Theeffect holds for a metal drain electrode including a gold tin layer(AuSn) and diffusion soldering die-attached process and a nickel silver(NiAg) metal drain electrode in combination with a soft solderdie-attached process.

In FIG. 5B, line 433 plots the measured values for the reverse recoverycharge Qrr for semiconductor devices which semiconductor portionsdeviate from each other in total thickness. The reverse recovery chargeabruptly decreases shortly before the base substrate is completelyremoved at x=x0.

In FIG. 5C, line 436 shows the on-state resistance R_(dson) as afunction of the thickness of the semiconductor die. Where a thinning thebase substrate by 10 μm at a remaining thickness of more than 20 μm hasonly low impact on R_(dson), removal of further portions of the basesubstrate reduces R_(dson) by more than 5%.

FIG. 5D summarizes the impact of the thickness of the base substrate onthe reverse recovery charge. In the diode operation mode of thesemiconductor device the electron hole plasma plots the drift zone downto the base substrate. Within the doped base substrate, the plasmaconcentration decreases and is pinned to “a zero concentration” at adistance to the interface between the base substrate and the epitaxiallayer in the range of some μm. Thinning of the semiconductor device intothis range, cross which plasma concentration usually decreases withinthe base substrate 105, decreases the plasma concentration at theinterface between the base substrate and the epitaxial layer cause holesstart to reach the metal drain electrode, where the recombine such thatemitter efficiency is reduced and plasma concentration in the wholedevice is reduced. If the base substrate is completely removed, thecharge carrier plasma density is pinned to zero within the epitaxiallayer.

FIGS. 6A to 9B apply the above described method to power semiconductordevices such as n-channel IGFETs 505, for example MOSFETs (metal oxidesemiconductor field effect transistors) of the enhancement type withn-type source regions, n-type drain structures and p-type body regions.Similar considerations apply to p-FETs with p-type source regions,p-type drain structure and n-type body region. The IGFETs 505 may have anominal drain current I_(D) greater 1A, e.g., greater 10A or greater100A.

In FIGS. 6A and 6B, the power semiconductor device is an IGFET 505without superjunction structure, wherein during manufacturing a thinningprocess such as wafer splitting or wafer grinding has completely removedthe base substrate.

A crystalline semiconductor material, e.g., silicon (Si), germanium(Ge), silicon germanium (Site) or an A_(III)B_(V) semiconductor materialforms a semiconductor portion 100 with a planar first surface 101 at afront side and a planar second surface 102 on the back of thesemiconductor portion 100. A minimum distance between the first andsecond surfaces 101, 102 defines a thickness ‘th’ and is related to thevoltage blocking capability the semiconductor device 500 is specifiedfor. For example, the die thickness th may be in a range from 40 μm to60 μm, in case the IGFET 505 is specified for a blocking voltage ofabout 500 V. Other IGFETs with higher blocking capability may be basedon semiconductor portions 100 with a die thickness th of several 100 μm.

In a plane parallel to the first surface 101, the semiconductor portion100 may have a rectangular shape with an edge length in the range ofseveral millimeters or a circular shape with a diameter of severalcentimeters. Directions parallel to the first surface 101 are horizontaldirections and directions perpendicular to the first surface 101 arevertical directions.

The IGFET 505 includes transistor cells TC formed at the front side ofthe semiconductor portion 100. Each transistor cell TC includes ann-type source region and a body region formed as a portion of a bodywell 120 a that extends from the first surface 101 into thesemiconductor portion 100. The body well 120 a forms first pn junctionspn1 with a drain structure 130 between the transistor cells TC and thesecond surface 102. The body regions separate the source regions of thetransistor cells TC from the drain structure 130. Source regions andbody regions of the transistor cells TC form second pn junctions and areboth connected to a metal source electrode 310. The source electrode 310may form or may be electrically connected to a source terminal S.

Gate electrodes of the transistor cells TC may be electrically connectedor coupled to a gate terminal G and are capacitively coupled to the bodyregions in the body well 120 a through gate dielectrics. Subject to avoltage applied to the gate terminal G, inversion channels are formed inthe body regions and allow an electron flow through the transistor cellsTC such that in an on-state of the IGFET 505 electrons enter the drainstructure 130 through the transistor cells TC.

The transistor cells TC may be planar cells with lateral gate structuresarranged outside of the contour of the semiconductor portion 100 ortrench cells with trench gate structures extending from the firstsurface 101 into the semiconductor portion 100, wherein the source andbody regions of the transistor cells TC may be formed in mesa portionsof the semiconductor portion 100 between the trench gate structures.

The drain structure 130 includes a heavily doped emitter layer 139directly adjoining the second surface 102. The emitter layer 139 forms alow-ohmic interface with a metal drain electrode 320 formed along thesecond surface 102. For example, formation of the metal drain electrode320 may include partly amorphizing the portion of the silicon crystalalong the second surface 102 and depositing aluminum, wherein siliconatoms diffuse to some degree into the deposited aluminum layer andaluminum atoms fill resulting gaps in the semiconductor crystal, whichresult from outdiffusion of silicon, to form protrusions or spikesextending outer several 100 nanometers or several micrometers into thesemiconductor portion 100. The drain structure 130 may further include alightly doped drift zone 131 of a uniform conductivity type. Aneffective dopant concentration in the drift zone 131 may be at least1E12 cm⁻³ and at most 1E17 cm⁻³.

The doping in the drift zone 131 may correspond to an initial backgrounddoping of an epitaxial layer, from which the semiconductor portion 100is formed. A field stop layer 135 may be sandwiched between the emitterlayer 139 and the drift zone 131. A mean dopant concentration in thefield stop layer 135 is at least 5 times a mean dopant concentration inthe drift zone 131 and at most a half of the maximum dopantconcentration in the emitter layer 139. The dopant concentration in thefield stop layer 135 may steadily decrease with increasing distance fromthe second surface 102 or may be uniform. According to otherembodiments, the mean dopant concentration in the field stop layer 135decreases in steps with increasing distance to the second surface 102.

A thickness of the emitter layer 139 may be less than 10 μm. A thicknessa2−a0 of the field stop layer 135 may be in the range from 5 μm to 20μm, for example between 8 μm and 15 μm. An integrated activated donorconcentration N_(D) between x=0 and x=a1 is less than 1.5E13 cm⁻², e.g.,at most 8E12 cm⁻².

FIG. 6B shows donor distribution 441 and acceptor distribution 442 alonga line perpendicular to the first surface 101. A hole distribution 443is pinned to 0 at the interface to the drain electrode 320, such thatthe reverse recovery charge Qrr is small. At the same time the activeimplant dose is sufficiently high to form a robust emitter, which hassufficient irradiation ruggedness.

The IGFET 505 of FIGS. 7A to 7B further includes a superjunctionstructure 180 including first regions 181 of the conductivity type ofthe source regions and the emitter layer 139 as well as second regions182 of the complementary conductivity type. A mean dopant concentrationin the superjunction structure is between 1E15 cm⁻³ to 1E18 cm⁻³. Anintegrated concentration of activated donors between the drain electrode320 and the second regions 182 is at most 1.5E13 cm⁻², for example atmost to 8E12 cm⁻².

FIG. 7B shows the donor distribution 451, the acceptor distribution 452as well as the hole distribution 453 in case the body diode is forwardbiased.

The IGFET 505 of FIGS. 8A to 8B differs from the one in FIGS. 6A to 6Bin that a remnant section of a heavily-doped base substrate forms adrain contact structure 137 sandwiched between the drift zone 131 andthe drain electrode 320, or in presence of a field stop layer 135,between the field stop layer 135 and the metal drain electrode 320. Athickness a0 of the drain contact structure 137 may be at most 10 μm,for example at most 5 μm. A mean dopant concentration in the draincontact structure 137 is at least 1E19 cm⁻³ and sufficiently high toform an ohmic contact with the metal of the metal drain electrode 320.

FIG. 8B shows that the donor distribution 461 is approximately uniformin the drain contact structure 137 between x=0 and x=a0. The holedistribution 463 in case of the forward-biased body diode is pinned tozero between x=0 and x=a0, wherein a0 is smaller than a distance wherethe hole distribution 463 would be pinned to zero in case of a thickerdrain contact structure 137.

FIGS. 9A to 9B refer to an IGFET 505 including a superjunction structure180, wherein a remnant base section 105 a of a base substrate forms thedrain contact structure 137.

According to FIG. 9B the donor distribution 471 is approximately uniformin the drain contact structure 137 between x=0 and x=a0. The holedistribution 473 in case of the forward-biased body diode is pinned tozero between x=0 and x=a0, wherein a0 is smaller than a distance wherethe hole distribution 473 would be pinned to zero in case of a thickerdrain contact structure 137.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat a variety of alternate and/or equivalent implementations may besubstituted for the specific embodiments shown and described withoutdeparting from the scope of the present invention. This application isintended to cover any adaptations or variations of the specificembodiments discussed herein. Therefore, it is intended that thisinvention be limited only by the claims and the equivalents thereof.

What is claimed is:
 1. A semiconductor device, comprising: transistorcells formed along a first surface at a front side of a semiconductorbody and comprising body regions of a first conductivity type; a driftregion of a second conductivity type that is opposite from the firstconductivity type and is disposed between the body regions and a secondsurface of the semiconductor body that is opposite from the firstsurface; and an emitter layer of the second conductivity type that isdisposed between the drift region and a second surface of thesemiconductor body, the emitter layer having a higher dopantconcentration than the drift region; a metal drain electrode directlyadjoining the emitter layer, wherein the metal drain electrode comprisesspikes extending into the emitter layer.
 2. The semiconductor device ofclaim 1, wherein an integrated concentration of activated dopants alonga shortest line between the metal drain electrode and a closest dopedregion of the first conductivity type is at most 1 E13 cm⁻².
 3. Thesemiconductor device of claim 2, wherein the shortest line extendsthrough the emitter layer and the drift zone.
 4. The semiconductordevice of claim 2, further comprising: a superjunction structurecomprising first regions which have the second conductivity type andsecond regions which have the first conductivity type, the first and thesecond regions of the superjunction structure alternating along ahorizontal direction parallel to the first surface in the drift region,wherein the closest doped region of the first conductivity type is thesecond regions of the superjunction structure.
 5. The semiconductordevice of claim 1, wherein along an interface between the metal drainelectrode and the emitter layer, an activated dopant concentration ofthe emitter layer allows carrier tunneling of electrons and holesbetween the metal drain electrode and the emitter layer.
 6. Thesemiconductor device of claim 1, wherein at least two of the spikes havea different height.
 7. The semiconductor device of claim 1, wherein amaximum vertical extension of the spikes is greater than 1 μm.
 8. Thesemiconductor device of claim 1, further comprising a field stop layerof the first conductivity type that is disposed between the drift regionand the emitter layer, wherein the field stop layer has a higher dopantconcentration than the drain region and a lower dopant concentrationthan the emitter layer.
 9. The semiconductor device of claim 1, whereina thickness of the emitter layer at most 10 μm.
 10. The semiconductordevice of claim 9, wherein a thickness of the field stop layer isbetween 5 μm and 20 μm.
 11. The semiconductor device of claim 1, whereina mean dopant concentration in the emitter layer is at least 1E19 cm-3.